
Originally Posted by
rnclark
Emil,
I remain unconvinced. The reasons are as follows. I test sensors a lot (professionally) and deriving the top end S/N is very difficult. With DSLRs, we are talking S/N at low ISOs above 200. That means that the uniformity of the light on the sensor must be uniform to much better than that level, and that is extremely difficult to do (e.g. at least to 1 part in 1000). If one uses a single source, you have 1/r squared effects, then if using optics, light falloff effects, then there are reflections and flare. If one is using extended sources and no optics you still have reflections which are very difficult to control.
I looked at some of my data and when stretched, yes I can see fixed pattern noise in the 1D4 data, but it is extremely small. I did some standard deviations on single 200x200 pixel images and they were ~2x higher than
the subtraction method. I then investigated and found what I expected: ramps due to uneven lighting. And this is only 200 pixel square areas. I did partial corrections for the ramp and reduced the difference to 20%, and it looks like with a good model for the light distribution, the single image standard deviation would be about 10% higher than two subtracted images/root 2. So fixed pattern noise would be very small and would not be visible on a log plot.
As the light levels drop, the S/N drops and the ramps in light level become less significant, so the difference in single versus two subtracted images becomes less, unless there is low level fixed pattern noise.
Regarding the 7D, what you observed are side effects due to the two green filters being used in the Bayer filter array, and software that didn't deal with it properly.
Another factor in fixed pattern noise and single image analysis, is one must separate the Bayer filters or the different transmission of the red, green, and blue filters, or those transmission differences will contribute to the derived standard deviation. I did separate the filters for my analysis.
Roger